2026 3rd International Conference on Remote Sensing Technology and Survey Mapping (RSTSM 2026)

Aischolar Aischolar
2026 3rd International Conference on Remote Sensing Technology and Survey Mapping (RSTSM 2026)
Event Holding type
Event type
Venue
Description

2026 3rd International Conference on Remote Sensing Technology and Survey Mapping (RSTSM 2026) will be held in Wuhan, Hubei Province, China, from March 6th to 8th, 2026.

 

Conference Website:https://ais.cn/u/VNvEbi

 

Call for papers

The topics of interest for submission include, but are not limited to:

â—•Track 1: Remote Sensing Technology and Applications

  1. Application of optical remote sensing technology in surface feature extraction and classification
  2. Optical texture analysis and application of high-resolution remote sensing images
  3. Improvement and enhancement of spatial and temporal resolution of optical remote sensing images
  4. computer vision-based aerial image processing and feature recognition technology
  5. Application of Optical Remote Sensing Technology in Environmental Monitoring and Resource Management

 

â—•Track 2: Laser Scanning Measurement Technology and Applications

  1. Application of laser scanning measurement technology in 3D mapping and building surveying
  2. Performance and accuracy of laser measurement instruments and sensors
  3. Laser Scanning Data for Underground Target Detection and Underground Object Imaging
  4. Laser scanning based data analysis

 

â—•Track 4: Remote Sensing Data Processing and Applications

  1. Remote Sensing Data Preprocessing and Correction Methods
  2. Remote Sensing Data Fusion and Feature Extraction
  3. Remote sensing data-based change detection and monitoring techniques
  4. Application of remote sensing data in natural disaster monitoring and prediction

 

â—•Track 3: Application of Computer Vision and Machine Learning in Remote Sensing and Surveying and Mapping

  1. Innovative Methods of Computer Vision Technology in Remote Sensing Image Interpretation and Analysis
  2. Computer algorithms and models based on remote sensing data monitoring
  3. deep learning and artificial intelligence applications in remote sensing and survey mapping
  4. Optical Imaging and Computer Algorithms for Defect Detection and Recognition

 

—Publication—

After 2-3 experts of the organizing committee strictly audited the contribution of the conference, all the final papers will be officially published by SPIE – The International Society for Optical Engineering (ISSN: 0277-786X) in the Conference Proceedings. The published papers will then be submitted to EI Compendex, Scopus for indexing.

 

—Important Dates—

Full Paper Submission Date:January 31, 2026

Registration Deadline:February 28, 2026

Final Paper Submission Date: February 27 , 2026

Conference Dates: March 6-8, 2026

 

Paper Submission—

Please send the full paper(word+pdf) to Submission System:

https://ais.cn/u/VNvEbi

Reviews

0 Comments

Write a Comment

Your email address will not be published. Required fields are marked *

Tags